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VERSION:2.0
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CALSCALE:GREGORIAN
METHOD:PUBLISH
BEGIN:VEVENT
UID:event-1989@www.360eventhub.com
DTSTAMP:20260721T173229Z
DTSTART;VALUE=DATE:20260608
DTEND;VALUE=DATE:20260611
SUMMARY:Semiconductor Wafer Test Conference
DESCRIPTION:Semiconductor Wafer Test Conference The Semiconductor Wafer T
 est Conference is a highly specialized industry event focused on the tes
 t\, validation\, reliability\, and quality assurance ecosystem within se
 miconductor manufacturing. This is not a broad general-tech exhibition. 
 It is a niche\, technical\, and decision-maker-heavy conference that att
 racts professionals involved in wafer-level test\, probe cards\, test eq
 uipment\, metrology\, packaging\, reliability engineering\, device chara
 cterization\, and advanced semiconductor production workflows. For atten
 dee-list and buyer-intent research\, this event …\n\nhttps://www.360ev
 enthub.com/event.php?slug=semiconductor-wafer-test-conference
LOCATION:Omni La Costa Resort & Spa\, Carlsbad\, California\, United Stat
 es
URL:https://www.360eventhub.com/event.php?slug=semiconductor-wafer-test-c
 onference
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